ESD SP5.3.2:2013
ESD SP5.3.2:2013 Electrostatic Discharge Sensitivity Testing - Socketed Device (Sdm) - Component Level Gives a test method for generating a Socketed Device Model (SDM) test on a component integrated circuit (IC) device.
Table of Contents
1.0PURPOSEANDSCOPE1.1PURPOSE
1.2SCOPE
2.0REFERENCES
3.0DEFINITIONS
4.0REQUIREDEQUIPMENT
4.1SOCKETEDDEVICEMODEL(SDM)ESDTESTER
4.2WAVEFORMVERIFICATIONEQUIPMENT
5.0EQUIPMENTCALIBRATIONANDVERIFICATION
REQUIREMENTS
5.1EQUIPMENTCALIBRATION
5.2TESTERVERIFICATION
6.0EQUIPMENTQUALIFICATIONANDVERIFICATION
PROCEDURES
6.1WAVEFORMVERIFICATIONPROCEDURE
6.2TESTERQUALIFICATIONANDRE-QUALIFICATION
PROCEDURE
6.3RECOMMENDEDTESTERFUNCTIONALITYCHECK
7.0SDMTESTINGRECOMMENDATIONS
7.1COMPONENTHANDLING
7.2COMPONENTSTATICANDDYNAMICTESTS
7.3TESTTEMPERATURE
7.4SAMPLESIZE
7.5PINSTRESSING
8.0SDMESDSTRESSTESTINGPROCEDURE
8.1TESTPRACTICE
9.0FAILURECRITERIA
10.0SDMWAVEFORMPARAMETERS
ANNEXA:WAVEFORMVERIFICATIONLIMITPROCEDURE