Table of Contents
1SCOPE
1.1Scope
1.2Limitations
1.3Use
1.4Objective
1.5Application
2ApplicableDocuments
3GeneralRequirements
3.1ScreeningRequirements
3.1.1Screening
3.1.2TestProcedures
3.1.3TestandDataSubmission
3.1.4DetailTestRequirements
3.2RequestforDeviations
3.3ScreeningFacility
3.4ScreeningFacility'sResponsibility
4DetailRequirements
4.1MinimumScreeningRequirements
5N/A
6Notes
6.1Definitions
6.1.1Screening
6.1.2Inspection
6.1.3Examination
6.1.4Testing
6.1.5Screeninginspection
6.1.6Part
6.1.7NASAStandardParts
6.1.8NonstandardParts
6.1.9NondestructiveTests
6.1.10CommercialLaboratory
6.2InformationConcerningthisDocument
AppendixA-MinimumScreeningRequirementsforCapacitors
AppendixB-MinimumScreeningRequirementsforCircuitBreakers
AppendixC-MinimumScreeningRequirementsforCrystals,
FrequencyStandard
AppendixD-MinimumScreeningRequirementsforElectromagnetic
Parts(Transformers,Inductors,Filtersand
RotatingParts)
AppendixE-MinimumScreeningRequirementsforFuses
AppendixF-MinimumScreeningRequirementsforMeters
AppendixG-MinimumScreeningRequirementsforMicrocircuits
AppendixH-MinimumScreeningRequirementsforRelays
AppendixI-MinimumScreeningRequirementsforResistors
AppendixJ-MinimumScreeningRequirementsforDiscrete
SemiconductorDevices
AppendixK-MinimumScreeningRequirementsforSwitches
AppendixL-MinimumScreeningRequirementsforTransducers
AppendixX-NonstandardPartsSelectionandApplication
Criteria Abstract
Establishes minimum screening requirements for nonstandard electrical and electronic parts, as specified in the applicable appendices that are to be used in high-reliability electronic equipment for space applications.
