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ITU O.172:2005

ITU O.172:2005 Jitter And Wander Measuring Equipment For Digital Systems Which Are Based On The Synchronous Digital Hierarchy (sdh) Specifies instrumentation that is used to generate and measure jitter and wander in digital systems based on the SDH. Addresses measurement requirements for both SDH line interfaces and SDH tributary

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Table of Contents

1Scope
2References
2.1Normativereferences
2.2Informativereferences
3Definitions
4Abbreviations
5Conventions
6Functionalblockdiagram
7Interfaces
7.1Opticalinterfaces
7.2Electricalinterfaces
7.3Externalreferenceclockinput
7.4Inputinterfacesensitivity
8Jitter/wandergenerationfunction
8.1Modulationsource
8.2Clockgenerator
8.3Digitaltestpatterngenerator
8.4Pointersequencegenerator
8.5Minimumjitter/wandergenerationcapability
8.6Generationaccuracy
9Jittermeasurementfunction
9.1Referencetimingsignal
9.2Measurementcapabilities
9.3Measurementbandwidths
9.4Measurementaccuracy
9.5Jittertransfermeasurementaccuracy
9.6Additionalfacilities
10Wandermeasurementfunction
10.1Referencetimingsignal
10.2MeasurementofTIE(TimeIntervalError)
10.3MeasurementoftransientTIE(TimeIntervalError)
10.4MeasurementofMTIE(MaximumTimeIntervalError)
10.5MeasurementofTDEV(TimeDeviation)
10.6Measurementoffrequencyoffset
10.7Measurementoffrequencydriftrate
11TDEVwandernoisegenerationfunction
12MTIEwandernoisegenerationfunction
13Operatingenvironment
AnnexA-Structuredtestsignalsforthemeasurementof
jitter
A.1Introduction
A.2TestsignalstructureforSTM-Nsignals
A.3TestsignalstructureforconcatenatedSTM-Nsignals
AnnexB-Definitionofband-limitedpeak-to-peakphaseslope
error
AnnexC-MTIEupperlimitforTDEVwandernoise
AppendixI-Guidelinesconcerningthemeasurementofjitter
inSDHsystems
AppendixII-Guidelinesconcerningthemeasurementofwander
inSDHsystems
II.1Wandermeasurements
II.2Clockstabilitymeasurements
AppendixIII-Guidelinesconcerningthegenerationofpointer
testsequences
AppendixIV-Totaljittermeasurementfunctionresponse
IV.1Introduction
IV.2Measurementfilterparameters
IV.3Masklimitsforhigh-passmeasurementfilterresponse
AppendixV-VerificationofMTIEandTDEVcalculationalgorithms
V.1TIEnoisesourcefunctionaldescription
V.2FirstexampleofTIEnoisegenerator
V.3SecondexampleofTIEnoisegenerator
AppendixVI-MTIEgenerationevaluation
AppendixVII-Methodforverificationofmeasurementresult
accuracyandintrinsicfixederror
VII.1Verificationdescriptionandapplication
VII.2Systemimplementation
VII.3Resultsandinterpretation
AppendixVIII-Methodforcharacterizationoftransmit
intrinsicjitter
VIII.1Verificationdescriptionandapplication
VIII.2Method
VIII.3Diagnostictestpattern
VIII.4Calculationofpeak-to-peakvaluefromthe
probabilitydistributionfunction

Abstract

Specifies instrumentation that is used to generate and measure jitter and wander in digital systems based on the SDH. Addresses measurement requirements for both SDH line interfaces and SDH tributary interfaces operating at PDH bit rates.

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