ITU O.175:2012
ITU O.175:2012 Jitter Measuring Equipment For Digital Systems Based On Xg-Pon Describes test instrumentation that is used to generate and measure timing jitter in digital systems based on the XG-PON.
Table of Contents
1Scope2References
3Definitions
4Abbreviationsandacronyms
5Conventions
6Functionalblockdiagram
7Interfaces
8Jittergenerationfunction
9Jittermeasurementfunction
10Operatingenvironment
AppendixI-Jitterevaluationmethodsforanoptical
networkunitburstmodetransmitter
Bibliography