Table of Contents
FOREWORD
CONTENTS
1Scope
2References
3Definitions
4Abbreviations
5Measurementmodesandeventstobemonitored
5.1Definitionofthemeasurementmodes
5.2Eventstobemonitored
5.2.1Networkevents
5.2.2Testsignalstructureevents
5.3Out-of-servicemeasurementmodes
5.3.1Modewithhigher-ordercontainer(C-4)
end-to-endtransparency
5.3.2Modewithhigher-ordercontainer(C-3)
end-to-endtransparency
5.3.3Modewithlower-ordercontainer(C-3)
end-to-endtransparency
5.3.4Modewithlower-ordercontainer(C-11/C-12/C-2)
end-to-endtransparency
5.3.5Modewithplesiochronoustributarymappingin
ahigher-ordercontainer(C-4)
5.3.6Modewithplesiochronoustributarymappingin
ahigher-ordercontainer(C-3)
5.3.7Modewithaplesiochronoustributarymappingin
alower-ordercontainer(C-3)
5.3.8Modewithaplesiochronoustributarymappingin
alower-ordercontainer(C-11/C-12/C-2)
5.3.9Modewithcontiguousconcatenatedstructures
(VC-2-XcandVC-4-Xc)end-to-endtransparency
5.4In-servicemeasurementmodes
5.4.1EventstobemonitoredforaSTM-NRegenerator
sectionedstructures
5.4.2EventstobemonitoredforaMultiplexsection
5.4.3Eventstobemonitoredforahigher-order
container(C-4)
5.4.4Eventstobemonitoredforahigher-order
container(C-3)
5.4.5Eventstobemonitoredforalower-order
container(C-3)
5.4.6Eventstobemonitoredforalower-order
container(C-11/C-12/C-2)
5.4.7EventstobemonitoredforVC-2-XcandVC-4-Xc
contiguousconcatenatedstructures
6Generator
6.1Synchronizationofthegenerator
6.2Bitrates
6.3Testsignalstructures
6.4Digitalsignaloutputs
6.4.1Digitalinterfaces
6.4.2Outputjitter
7Receiver
7.1Digitalsignalinputs
7.1.1Digitalinterfaces
7.1.2Inputjittertolerance
7.1.3Protectedmonitoringpoints
7.2Testsignalstructures
7.3Errorperformancemeasurement
7.3.1ErrorperformancemeasurementusingISM
facilitiesonly
7.3.2ErrormeasurementusingbothISMfacilities
andtestsequenceinformation
7.3.3Useoftheperformanceparameters
7.3.4Additionalerrormeasurement
8Miscellaneousfunctions
8.1Display
8.2Anomalyanddefectadditionontheoutputsignal
8.3Alarmanderrorindication
8.4Accesstooverheadbytes
8.5Demultiplexingcapability
8.6Eventstimestamping
8.7Outputtoexternalrecordingdevices
8.8Remotecontrolport
8.9TMNinterface
8.10AccesstoDataCommunicationChannels
9Operatingconditions
9.1Environmentalconditions
9.2Behaviourincaseofpowerfailure
AnnexA-Criteriafordetectinganomaliesanddefects
A.1Anomaliesrelatedtoperformancemeasurements
A.1.1OutofFrame(OOF)
A.1.2B1errors
A.1.3B2errors
A.1.4B3errors
A.1.5MultiplexSectionRemoteErrorIndication
(MS-REI)
A.1.6Higher-orderPathRemoteErrorIndication
(HP-REI)
A.1.7Lower-orderPathRemoteErrorIndication
(LP-REI)
A.1.8BIP-2errors
A.1.9TestSequenceError(TSE)
A.2Defectsrelatedtoperformancemeasurements
A.2.1LossofSignal(LOS)
A.2.2LossofFrame(LOF)
A.2.3RegeneratorSectionTraceIdentifierMismatch
(RS-TIM)
A.2.4MultiplexSectionAlarmIndicationSignal
(MS-AIS)
A.2.5MultiplexSectionRemoteDefectIndication
(MS-RDI)
A.2.6AdministrativeUnitLossofPointer(AU-LOP)
A.2.7AdministrativeUnitAlarmIndicationSignal
(AU-AIS)
A.2.8Higher-orderPathRemoteDefectIndication
(HP-RDI)
A.2.9Higher-orderPathTraceIdentifierMismatch
(HP-TIM)
A.2.10Higher-orderPathLossofMultiframe(HP-LOM)
A.2.11TributaryUnitLossofPointer(TU-LOP)
A.2.12TributaryUnitAlarmIndicationSignal(TU-AIS)
A.2.13Lower-orderPathRemoteDefectIndication
(LP-RDI)
A.2.14Lower-orderPathTraceIdentifierMismatch
(LP-TIM)
A.2.15LossofSequenceSynchronization(LSS)
A.3Othereventsnotrelatedtoperformancemeasurement
A.3.1Higher-orderPathPayLoadMismatch(HP-PLM)
A.3.2Lower-orderPathPayLoadMismatch(LP-PLM)
A.3.3Higher-orderPathunequipped(HP-UNEQ)
A.3.4Lower-orderPathunequipped(LP-UNEQ)
A.3.5Lossoftiminginput
A.3.6Lower-orderPathRemoteFailureIndication
(LP-RFI)
A.4Otherinformation
A.4.1PointerJustificationCounts(PJC+,PJC-)
AnnexB-ClassificationofSDHavailableindications
B.1Anomalyanddefectindications
AnnexC-Listoftestsignalstructures
C.1TestsignalstructureTSS1appliedtoallbytesof
aC-4higher-ordercontainer
C.2TestsignalstructureTSS2appliedtoallbytesof
aC-3higher-ordercontainer
C.3TestsignalstructureTSS3appliedtoallbytesof
aC-3lower-ordercontainer
C.4TestsignalstructureTSS4appliedtoallbytesof
(C-2,C-12,C-11)lower-ordercontainers
C.5TestsignalstructureTSS5appliedtoallPDH
tributarybitsmappedinaC-4container
C.6TestsignalstructureTSS6appliedtoallPDH
tributarybitsmappedinahigher-orderC-3container
C.7TestsignalstructureTSS7appliedtoallPDH
tributarybitsmappedinalower-orderC-3container
C.8TestsignalstructureTSS8appliedtoallPDH
tributarybitsmappedinalower-order(C-2,C-11,
C-12)...
C.9TestsignalstructureappliedtoVC-4-Xccontiguous
concatenatedstructures
C.10TestsignalstructureappliedtoVC-2-Xccontiguous
concatenatedstructures
AppendixI-Examplesofmeasuringequipmentconnections
tonetworkelementsillustratingdifferent
out-of-service... Abstract
Specifies the measuring equipment and the related test signal structures to perform in-service or out-of-service error performance measurements on STM-N interfaces.
