JIS-K-3850-1

JIS-K-3850-1 Part 1: Optical Microscopy Method & Scanning Electron Microscopy Method - Measuring Method

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Part 1: Optical Microscopy Method font-size:1.5em">ORDER

Document Number

JIS K 3850-1:2006

Revision Level

2006 EDITION

Status

Current

Publication Date

Jan. 1, 2006

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