TIA 455-127:2006
TIA 455-127:2006 Fotp-127-a - Basic Spectral Characterization Of Laser Diodes The intent of this test procedure is to measure the central wavelength, peak wavelength, and the spectral width (rms, MSTM, 15 dB down and FWHM) of a Multilongitudinal Mode (MLM) semiconductor laser d